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Books by Wolfgang Osten
  | | Optical Inspection of Microsystems, Second Edition(2nd Edition) (Optical Science and Engineering) von Wolfgang Osten Hardcover, 590 Seiten, Veröffentlicht 2019 von Crc Press ISBN-13: 978-1-4987-7947-0, ISBN: 1-4987-7947-6 |
 | | Fringe 2005(Reprint) The 5th International Workshop on Automatic Processing of Finge Patterns von Wolfgang Osten Paperback, 714 Seiten, Veröffentlicht 2010 von Springer ISBN-13: 978-3-642-06533-0, ISBN: 3-642-06533-3 "In 1989 the time was hot to create a workshop series dedicated to the dicussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial applications of optical metrology. However, such a workshop must take place in a dynamic environment. The- fore the ..." |
 | | Optical Inspection of Microsystems(1st Edition) (Optical Science and Engineering) von Wolfgang Osten Paperback, 503 Seiten, Veröffentlicht 2019 von Crc Press ISBN-13: 978-0-367-39057-0, ISBN: 0-367-39057-4 "Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial ..." |
 | | Fringe 2013(Reprint) 7th International Workshop on Advanced Optical Imaging and Metrology von Wolfgang Osten Paperback, 976 Seiten, Veröffentlicht 2016 von Springer ISBN-13: 978-3-662-52360-5, ISBN: 3-662-52360-4 "In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are: - New methods and tools for the generation, acquisition, processing, ..." |
 | | Fringe 2009 6th International Workshop on Advanced Optical Metrology von Wolfgang Osten, Malgorzata Kujawinska Paperback, 792 Seiten, Veröffentlicht 2009 von Springer ISBN-13: 978-3-642-03050-5, ISBN: 3-642-03050-5 "21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 ..." |
 | | Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology von Wolfgang Osten Hardcover, 980 Seiten, Veröffentlicht 2013 von Springer ISBN-13: 978-3-642-36358-0, ISBN: 3-642-36358-X "In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are: - New methods and tools for the generati ..." |
 | | Fringe 2009 6th International Workshop on Advanced Optical Metrology (Paperback) von Wolfgang Osten, Malgorzata Kujawinska Paperback, 792 Seiten, Veröffentlicht 2014 von Springer ISBN-13: 978-3-642-43169-2, ISBN: 3-642-43169-0 "21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and We ..." |
 | | "Fringe `93(1st Edition) proceedings of the 2nd International Workshop on Automatic Processing of Fringe Patterns held in Bremen, October 19 - 21, 1993. Physical research ; Vol. 19 ;" [Paperback] [Jan 01, 1993] von Werner Jüptner, Wolfgang Osten Hardcover, 501 Seiten, Veröffentlicht 1993 von Wiley-Vch ISBN-13: 978-3-05-501612-7, ISBN: 3-05-501612-2 "For testing of materials there exists a variety of very modern optical metrological methods, especially laser methods. The automatic processing - optical or digital image processing - of fringe patterns that are always emerging in this connection is the central point of the proceedings of Fringe '93." |
 | | Optical Imaging and Metrology(1st Edition) Advanced Technologies von Wolfgang Osten, Nadya Reingand Hardcover, 502 Seiten, Veröffentlicht 2012 von Wiley-Vch ISBN-13: 978-3-527-41064-4, ISBN: 3-527-41064-3 "A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to ..." |
 | | Optical Measurement Systems for Industrial Inspection VII 23-26 May 2011, Munich, Germany von Peter H. Lehmann, Wolfgang Osten, Kay Gastinger Paperback, 1,276 Seiten, Veröffentlicht 2011 von Spie-International Society For Optical Engineering ISBN-13: 978-0-8194-8678-3, ISBN: 0-8194-8678-7 "These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature." |
 | | Optical Micro- and Nanometrology Volume III: 13-16 April 2010, Brussels, Belgium von Christophe Gorecki, Anand Asundi, Wolfgang Osten, Comité Belge D'optique Paperback, 428 Seiten, Veröffentlicht 2010 von Spie Press ISBN-13: 978-0-8194-8191-7, ISBN: 0-8194-8191-2 "Includes Proceedings Vol. 7821" |
 | | Optical Micro and Nanometrology in Microsystems Technology(Illustrated) (Proceedings of SPIE) von Christophe Gorecki, Anand Asundi, Wolfgang Osten Paperback, 1 Seiten, Veröffentlicht 2006 von Society Of Photo Optical ISBN-13: 978-0-8194-6244-2, ISBN: 0-8194-6244-6 |
 | | Interferometry XI applications, 10-11 July 2002, Seattle USA von Wolfgang Osten, Boeing Company Paperback, 396 Seiten, Veröffentlicht 2002 von Spie Society Of Photo-Optical Instrumentation Engi ISBN-13: 978-0-8194-4545-2, ISBN: 0-8194-4545-2 |
 | | Optical Micro- and Nanometrology in Microsystems Technology II (Proceedings of Spie) von Christophe Gorecki, Wolfgang Osten, Anand K. Asundi Paperback, 368 Seiten, Veröffentlicht 2008 von Society Of Photo Optical ISBN-13: 978-0-8194-7193-2, ISBN: 0-8194-7193-3 "Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature." |
 | | Interferometry XIV Applications (Proceedings of Spie) von Christophe Gorecki, Wolfgang Osten, Erik L. Novak Paperback, 256 Seiten, Veröffentlicht 2008 von Society Of Photo Optical ISBN-13: 978-0-8194-7284-7, ISBN: 0-8194-7284-0 "Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature." |
 | | Optical Inspection of Microsystems(1st Edition) (Optical Science and Engineering) von Wolfgang Osten Hardcover, 503 Seiten, Veröffentlicht 2006 von Crc Press ISBN-13: 978-0-8493-3682-9, ISBN: 0-8493-3682-1 "Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial ..." |
 | | Interferometry 13 Applications (Proceedings of SPIE) von Erik Novak, Wolfgang Osten, Christophe Gorecki Paperback, 326 Seiten, Veröffentlicht 2006 von Society Of Photo Optical ISBN-13: 978-0-8194-6372-2, ISBN: 0-8194-6372-8 "Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature." |
 | | Interferometry Applications (Proceedings of SPIE) von Wolfgang Osten, Erich Novak, Erik Novak Paperback, 398 Seiten, Veröffentlicht 2004 von Society Of Photo Optical ISBN-13: 978-0-8194-5470-6, ISBN: 0-8194-5470-2 "Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature." |
 | | Optical Measurement Systems for Industrial Inspection III(Illustrated) (Proceedings of Spie) von Wolfgang Osten, Katherine Creath, Malgorzata Kujawinska, Wissenschaftliche Gesellschaft Lasertechnik Paperback, 914 Seiten, Veröffentlicht 2003 von Society Of Photo Optical ISBN-13: 978-0-8194-5014-2, ISBN: 0-8194-5014-6 "At head of title: proceedings of SPIE, SPIE--the Society for Optical Engineering." |
 | | Selected Papers on Holographic Interferometry Applications (Milestone Vol. MS170) von Rajpal S. Sirohi, Wolfgang Osten, Fook S. Chau, Huai M. Shang, Cho Tay, Hua Shang, Fook Chau Hardcover, 768 Seiten, Veröffentlicht 2001 von Spie Publications ISBN-13: 978-0-8194-4338-0, ISBN: 0-8194-4338-7 "I. Ostrovskii Mechanics (Soviet Physics— Technical Physics 1969) 527 Holographic subsonic flow visualization C. J. Reinheimer, C. E. Wiswall, R. A. Schmiege, R. J. Harris, J. E. Dueker (Applied Optics 1970) 534 Determination of three-dimensional density fields from holographic interferograms Robert D. Matulka, Daniel J. Collins (Journal of Applied Physics 1971) 545 Use of holography for visualization of the wake of projectiles in h ..." |
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